YOLO Algorithm-Based Crack Detection: A Scientometrics Literature Review
List of Authors
Ariffin M., Ismail MIS, Luxin Fan, SaiHong Tang, Xinming Wang
Keyword
Crack Detection; Deep Learning; Scientometric Analysis
Abstract
This review paper examines the development and current status of the crack detection research field through bibliometrics and critical analysis, focusing on the You Only Look Once (YOLO) algorithm. The authors evaluate trends in the field, influential research journal articles, and collaborations between different countries from various sources, and conclude that China is at the forefront. The analysis shows a significant increase in the number of publications since 2019, highlighting the growing interest of researchers in automated crack detection. A critical analysis of key research reveals the improvement of YOLO algorithms to address challenges such as changing lighting and complex backgrounds, highlighting the development and application of YOLO in infrastructure maintenance to improve accuracy and efficiency in real-world scenarios.